Hioki ST5680, Instruction Manual, Page: 109 / 253

109
Data Memory Function
8.4 Data Memory Function
Test results (up to 32,000 results) can be saved to the internal memory of the instrument. The
measurement results saved inside the instrument can be acquired either by saving them to a USB
flash drive or by using a communications command.
Information to be saved
Test mode
DCW, IR, W-IR, IR-W, program
Test start date and time yy-mm-dd hh:mm:ss
Measured value
Voltage, current, resistance
Measurement range Withstand voltage test mode, insulation resistance test mode
Remaining test time
(Elapsed test time for CONT)
Seconds
Judgment results PASS, UPPER FAIL, LOWER FAIL, UPPER LOWER FAIL, other
Timer type Test time, voltage rise time
• There is no memory backup function available. Memory data is cleared when the instrument is
turned off.
• Save the measurement results saved inside the instrument to a USB flash drive or acquire them
using the
:MEMory:FETCh?
command.
• Internal memory is automatically deleted if memory data is saved to a USB flash drive or is
acquired using a communications command.
• When the number of the measurement results saved in the instrument reaches 32,000,
[MEM:FULL]
is displayed and no more measured values are saved. If restarting data saving,
either load the memory from the instrument internal memory or clear the memory data.
• For information using a USB flash drive, see “10.1 Using USB Flash Drive” (p. 124).
Setting the memory function
Sets whether to enable or disable the memory functions. If enabled, the test results are
automatically saved to the internal memory in the instrument when the test finishes.
1
Press [SYSTEM] > [STATE] on the setting
screen.
ON The memory function is activated.
OFF * 1 Disables the memory function.
*1. Default setting
Various Functions
HIOKI ST5680A961-00