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Creating a rise time testing mask
Mask template testing can be used to test the rise time of a signal, including
specifying an upper limit for rise time. For example, you can specify that the
rise time must be 15 ns or faster to pass the test.
Use the voltage and time readouts of the mask editor to ensure the correct
settings. In the following figure, T1 and T2 are the critical points for
determining the maximum rise time limit (rise time limit = T2 – T1).
Example of a definition of a rise time testing mask
Figure 2– 16
Operating the Measurement/Storage Module
Creating a rise time testing mask
2–48
Summary of Contents for 54657A
Page 5: ...Installation 1 Reference Information 3 Operating the Measurement Storage Module 2 Index v ...
Page 6: ...vi ...
Page 8: ...3 Reference Information Operating Characteristics 3 3 Index Contents Contents 2 ...
Page 9: ...1 Installation ...
Page 16: ...1 8 ...
Page 17: ...2 Operating the Measurement Storage Module ...
Page 73: ...3 Reference Information ...
Page 80: ...3 8 ...
Page 87: ...Voltage Time Cursors Press this key to obtain this menu ...
Page 88: ...Print Utility Trace Trace Press this key to obtain this menu ...