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Creating a delay testing mask
A mask can be used to test the channel to channel delay of two input signals.
The shape of the mask varies depending on the channel 2 edge selected (stop
edge). Different masks are needed for different edge selections.
To test the channel to channel delay of the signal connected to channel 2, the
stop edge of the signal is tested instead of actually measuring the delay. The
test can be conducted by triggering on the start edge (channel 1), and testing
for the location of the stop edge (channel 2). An example mask is shown in
the following figure.
Example of a mask template used in channel to channel delay
Figure 2– 13
Operating the Measurement/Storage Module
Creating a delay testing mask
2–42
Summary of Contents for 54657A
Page 5: ...Installation 1 Reference Information 3 Operating the Measurement Storage Module 2 Index v ...
Page 6: ...vi ...
Page 8: ...3 Reference Information Operating Characteristics 3 3 Index Contents Contents 2 ...
Page 9: ...1 Installation ...
Page 16: ...1 8 ...
Page 17: ...2 Operating the Measurement Storage Module ...
Page 73: ...3 Reference Information ...
Page 80: ...3 8 ...
Page 87: ...Voltage Time Cursors Press this key to obtain this menu ...
Page 88: ...Print Utility Trace Trace Press this key to obtain this menu ...