Tektronix 5110, Инструкция по эксплуатации

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VOLTAGE AND WAVEFORM CONDITIONS
Dangerous potentials exist at several points throughout this instrument. When the
instrument is operated with the covers removed, do not touch exposed connections or
components. Some transistors have voltages present on their cases. Disconnect the
power source before replacing parts.
RECOMMENDED TEST EQUIPMENT
Item
Specifications
Recommended Type
Test oscilloscope system
Deflection factor, 1 mV to 50 V/div; input
impedance, 1 megohm; frequency
response, de to 2 MHz. Probe: 10X
attenuation probe compatible with
vertical
input.
Tektronix 5110, 5A13N, 5B10N
oscilloscope system orequiv. Use a
Tektronix P6108 or P6062A Probe.
Voltmeter (Non-loading
digital multimeter)
Range, 0 to 250 V; input impedance,
10 megohms.
Tektronix DM 501 Digital
Multimeter with power module.
VOLTAGE CONDITIONS
Voltage measurements on this diagram were made under the following conditions:
An amplifier unit is installed in the left vertical compartment (for power supply loading). INTENSITY control is set fully ccw.
Voltmeter common is connected to chassis ground.
WAVEFORM CONDITIONS
OSCILLOSCOPE UNDER TEST.
Install an amplifier unit in the left vertical compartment and a time-base unit in the
horizontal compartment. Connect the CALIBRATOR output signal to the amplifier unit (set vertical input coupling to de
and volts/div for a 2-division display). Set the time-base unit for internal auto-trigger, 2 ms/division sweep rate.
TEST OSCILLOSCOPE.
Set the test oscilloscope triggering for auto mode with ac coupling from the internal source and
set vertical input coupling to ac. Connect a 10X Probe to the vertical input. Position the display as necessary.
NOTE
The waveforms shown are actual waveform photographs taken with a Tektronix Oscilloscope Camera System and
Projected Graticule. Vertical deflection factor shown on the waveform is the actual deflection factor from the probe tip.
Voltages and waveforms on the diagrams are not absolute and may vary between instruments because of component
tolerances, internal calibration, or front-panel settings. Readouts are simulated in larger-than-normal type.
100 mV
2 his
r
L