Sun Microsystems StorEdge T3+, Руководство по обслуживанию

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8-18 Sun StorEdge T3 and T3+ Array Field Service Manual • September 2001
If, after running
fast_find
in both directions, the problem has not been isolated to
a single bad FRU, the bad FRU might be either the interconnect cable, the
interconnect card, or both.
a. Replace the interconnect cable and retest.
b. Replace the interconnect card and retest
If the problem persists, continue to the next step.
4. Perform an
ofdg find
operation.
The loop is given a Go or No-Go status with progress indications. If a failure is
detected, then Loop Fault Diag is automatically invoked to find the bad disk ports.
If
ofdg find
is not successful in solving the problem, the backplane should be
suspected. See Section 9.2, “Replacing the Chassis/Backplane Assembly” on
page 9-2” for details.
8.3.8.1 The
health_check
Option
The
health_check
option provides a fast Go/No-Go Loop test for all the loops in
the Sun StorEdge T3 array. The
health_check
option calls
fast_test
multiple
times, one time for each loop.
8.3.8.2 The
ofdg fast_test
Option
The
fast_test
option provides a fast Go/No-Go Loop test.
The
fast_test
option performs the following steps:
1. LAC_Reserve the FC-AL Loop device under test (DUT).
2. Test next nearest enclosure on Loop DUT.
3. Repeat Step 2 until all enclosures are tested.
4. LAC_Release the FC-AL Loop device under test (DUT).
The
fast_test
option uses only the two worst case data patterns as shown below:
:/:<4> ofdg find u1l1
#define ONDG_PATTERN_FOUR 0x7E7E7E7E /* from SUN */
#define ONDG_PATTERN_SIX 0x4A4A4A4A /* from SUN */