◇
44
has to be filtered, so the analyze response rate is 0.1s class.
Zone B: sampling analyze circuit rate is too slow, and long-time over-
flow may cause damage of the DUT, as well as effect the output circuit.
In circuit, current fast response circuit is added for compensating slow
sampling response. It can respond with the overflow signal quickly, but
if current waveform is big, high accuracy contrast can’t be performed,
only the coarse over range judge.
Zone C: Arc detection circuit. There is air breakdown due to high
voltage, which causes the partial high frequency self-excitation known
as corona discharge, especially at sharp edges. There is low frequency
current detection in current sampling circuit, and the fast partial
discharge signal can’t be handled by this. Arc detection circuit only
samples the changeable amplitude to find the potential defect in
current return circuit.
NOTE: The AC test frequency is 50/60Hz.
4.4.9
Fail judgment
When a setting exceeds its corresponding limit, the instrument will judge the DUT
as a failure and the following results are: the current test is stopped, the voltage
output is cut off, and the test result will be dealt with.
4.4.10
Dealing with test results
If no setting exceeds the limits listed in the right part of the below table, the
instrument will judge the DUT as passed. And then PASS will be displayed on the
screen, the pass indicator will light (this is controlled by PASS HOLD in SYSTEM1)
as well. Otherwise, FAIL and the fail reason (HI, as shown in below table) will be
displayed and the failure indicator will light (this is controlled by AFTR FAIL in
SYSTEM2). When the results are output and some other test items are waiting to
be dealt with, the instrument will transfer to the next test item or it will exit from
the test waiting status.
STEP:
01/0
1
AC
SCAN: 1X2X3X4X5X6X7X8X
VOLT:
1.000 kV
F A I L
LOCK
UPPER: 1.000 mA
OFST
REAL:
1.000 mA
RMT
TIME:
1.0
S
HI
ERR
ARC:
1.0
mA
