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37
4.3.4
Open and short detection test parameter setup:
STEP:
1/1
OS
SCAN:
1X2X3X4X5X6X7X8X
OPEN:
10%
LOCK
SHRT:
OFF
OFST
STAN:
NONE
RMT
ERR
GET
F1
F2
F3
F4
F5
Figure 4.3.4 OS setup interface
Instruction of OS test parameters:
OPEN: 10%~100%
Percentage of open judge value of standard value
SHRT: OFF~100%~500% Percentage of short judge value of standard value
STAN: Previous standard
value
Sampled known-good standard value
GET
Measure the distribution parameter of the
currently connected DUT and take it as the new
standard value
Note: 1. When the cursor is in the position as the table above, F1 position displays
GET.
2. Press F1 function key, the instrument enters standard value sampling
status. The instrument outputs 100V voltage in sampling, and the current
flowing through the DUT can be obtained within 100ms. (Please be taking
attention of voltage output)
3. The capacitance value here is not the real capacitance value, but the value
of the sampled current being transferred via impedance. The value should
be close to that of capacitor installed in the test terminal. (The sampling
current is not only generated by a capacitor, but rather all DUT have
capacitive elements.)
OPEN SHORT value setup: the OS function can be set to meet the following
necessary conditions:
1.
The value of the test impedance when the instrument is not connected to the
DUT and the maximum value of the test impedance when connecting the DUT
have an obvious separation zone, of which any point can be entered as an OPEN
threshold level.
2.
The minimum value of the impedance when the measured piece is good and the
value of the impedance when the measured piece is in short-circuit have an
obvious separation zone, of which any point can be entered as a SHORT level.
