
Maintenance manual
Adjustments
2-3
3)
Wafer mapping parameter setting registration
Using Test 12, set the wafer mapping parameters according to the cassette state and the wafer thickness.
Press the Wafer No. selector button [12], then press the [Start] button.
The submenu appears on the liquid crystal panel.
M1:Mapping auto adjust
M2:Mapping result display
M3:Input parameter
Auto Disp Manual
M1:Adjust mapping
M2:Save
result : OK
1.Start:48500 Thick1:1500 Thick25:1500
2.Start:48500 Thick1:1500 Thick25:1500
3.Start:48500 Thick1:1500 Thick25:1500
No |Size |Thick
|Speed |comment
x1 | 200 |725-400 |High
|
2 | 200 |725-400 |High
|
3 | 200 |725-400 |High
|
4 | 200 |725-400 |High
|
5 | 200 |725-400 |High
|
6 | 200 |725-400 |High
|
OK
Cancel PageUp PageDn
Adjust Save
[M1]: Executes the automatic mapping parameter adjustment <Mapping
auto adjust>.
Press the [M1] button <Auto>.
The wafer types currently registered are displayed on the liquid crystal
panel.
Using the 4-way button, move the <x> to the item to add, then press the
[M1] button <Ok>.
Insert the wafers to be registered in the lowest and highest slots of the
cassette, and set the cassette in the cassette table.
The menu appears on the liquid crystal panel.
[M1]: Do the mapping adjustment <Adjust mapping>.
Press the [M1] button <Adjust>.
The elevator moves down to the lowest point, and then it moves up and
stops at the upper limit.
If the display shows <result : OK> to indicate that the mapping data has no
problems, press the [M2] <Save> button to register the data.
If the display shows NG (No Good), check the wafer insertion slot positions
in the cassette.
After the setting is completed, press the [Quit] button to terminate Test 12
[M1] automatic mapping parameter adjustment.
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Содержание AL120-6Series
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