Chapter 17 Flash Memory
MPC5602P Microcontroller Reference Manual, Rev. 4
372
Freescale Semiconductor
During erase suspend, all reads to blocks targeted for erase return indeterminate data.
An erase suspend can be initiated by changing the value of the MCR[ESUS] bit from 0 to 1. MCR[ESUS]
can be set to 1 at any time when MCR[ERS] and MCR[EHV] are high and MCR[PGM] is low. A 0-to-1
transition of MCR[ESUS] causes the module to start the sequence that places it in erase suspend.
The user must wait until MCR[DONE] = 1 before the Module is suspended and further actions are
attempted. MCR[DONE] will go high no more than t
ESUS
after MCR[ESUS] is set to 1.
Once suspended, the array may be read. Flash core reads while MCR[ESUS] = 1 from the block(s) being
erased return indeterminate data.
Example 17-3. Sector Erase Suspend
MCR
= 0x00000007;
/* Set ESUS in MCR: Erase Suspend */
do
/* Loop to wait for DONE=1 */
{ tmp
= MCR;
/* Read MCR */
} while ( !(tmp & 0x00000400) );
Notice that there is no need to clear MCR[EHV] and MCR[ERS] in order to perform reads during erase
suspend.
The Erase sequence is resumed by writing a logic 0 to MCR[ESUS].
MCR[EHV] must be set to 1 before MCR[ESUS] can be cleared to resume the operation.
The Module continues the erase sequence from one of a set of predefined points. This may extend the time
required for the erase operation.
Example 17-4. Sector Erase Resume
MCR
= 0x00000005;
/* Reset ESUS in MCR: Erase Resume */
17.3.8.1.3
User Test mode
User Test mode is a customer-accessible mode that can be used to perform specific tests to check the
integrity of the Flash module. Three kinds of test can be performed:
•
Array integrity self-check
•
Margin mode read
•
ECC logic check
The User Test mode is equivalent to a Modify operation. Read accesses attempted by the user during User
Test mode generate a Read-While-Write Error (the MCR[RWE] bit is set).
User Test operations are not allowed on the Test and Shadow blocks.
17.3.8.1.3.1 Array integrity self check
Array integrity is checked using a predefined address sequence (proprietary), and this operation is
executed on selected and unlocked blocks. Once the operation is completed, the results of the reads can be
checked by reading the MISR value (stored in UMISR0–4), to determine if an incorrect read, or ECC
detection was noted.
Содержание SAFE ASSURE Qorivva MPC5601P
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Страница 62: ...Chapter 2 MPC5602P Memory Map MPC5602P Microcontroller Reference Manual Rev 4 62 Freescale Semiconductor ...
Страница 104: ...Chapter 4 Clock Description MPC5602P Microcontroller Reference Manual Rev 4 104 Freescale Semiconductor ...
Страница 128: ...Chapter 6 Power Control Unit MC_PCU MPC5602P Microcontroller Reference Manual Rev 4 128 Freescale Semiconductor ...
Страница 272: ...Chapter 12 e200z0 and e200z0h Core MPC5602P Microcontroller Reference Manual Rev 4 272 Freescale Semiconductor ...
Страница 280: ...Chapter 14 Crossbar Switch XBAR MPC5602P Microcontroller Reference Manual Rev 4 280 Freescale Semiconductor ...
Страница 306: ...Chapter 16 Internal Static RAM SRAM MPC5602P Microcontroller Reference Manual Rev 4 306 Freescale Semiconductor ...
Страница 380: ...Chapter 17 Flash Memory MPC5602P Microcontroller Reference Manual Rev 4 380 Freescale Semiconductor ...
Страница 532: ...Chapter 21 LIN Controller LINFlex MPC5602P Microcontroller Reference Manual Rev 4 532 Freescale Semiconductor ...
Страница 578: ...Chapter 22 FlexCAN MPC5602P Microcontroller Reference Manual Rev 4 578 Freescale Semiconductor ...
Страница 708: ...Chapter 25 FlexPWM MPC5602P Microcontroller Reference Manual Rev 4 708 Freescale Semiconductor ...
Страница 742: ...Chapter 26 eTimer MPC5602P Microcontroller Reference Manual Rev 4 742 Freescale Semiconductor ...
Страница 760: ...Chapter 27 Functional Safety MPC5602P Microcontroller Reference Manual Rev 4 760 Freescale Semiconductor ...
Страница 782: ...Chapter 28 Fault Collection Unit FCU MPC5602P Microcontroller Reference Manual Rev 4 782 Freescale Semiconductor ...
Страница 788: ...Chapter 29 Wakeup Unit WKPU MPC5602P Microcontroller Reference Manual Rev 4 788 Freescale Semiconductor ...
Страница 798: ...Chapter 30 Periodic Interrupt Timer PIT MPC5602P Microcontroller Reference Manual Rev 4 798 Freescale Semiconductor ...
Страница 816: ...Chapter 32 Cyclic Redundancy Check CRC MPC5602P Microcontroller Reference Manual Rev 4 816 Freescale Semiconductor ...
Страница 848: ...Chapter 33 Boot Assist Module BAM MPC5602P Microcontroller Reference Manual Rev 4 848 Freescale Semiconductor ...
Страница 930: ...Chapter 36 Nexus Development Interface NDI MPC5602P Microcontroller Reference Manual Rev 4 930 Freescale Semiconductor ...