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IEEE 1149.1 Test Access Port Controller (JTAGC)
32-12
Freescale Semiconductor
PXR40 Microcontroller Reference Manual, Rev. 1
32.4.5
Boundary Scan
The boundary scan technique allows signals at component boundaries to be controlled and observed
through the shift-register stage associated with each pad. Each stage is part of a larger boundary scan
register cell, and cells for each pad are interconnected serially to form a shift-register chain around the
border of the design. The boundary scan register consists of this shift-register chain, and is connected
between TDI and TDO when the EXTEST, SAMPLE, or SAMPLE/PRELOAD instructions are loaded.
The shift-register chain contains a serial input and serial output, as well as clock and control signals.
32.5
Initialization/Application Information
The test logic is a static logic design, and TCK can be stopped in either a high or low state without loss of
data. However, the system clock is not synchronized to TCK internally. Any mixed operation using both
the test logic and the system functional logic requires external synchronization.
To initialize the JTAGC module and enable access to registers, the following sequence is required:
1. Set the JCOMP signal to logic 1, thereby enabling the JTAGC TAP controller.
2. Load the appropriate instruction for the test or action to be performed.
Содержание PXR4030
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