Debug in Depth
ARM DDI 0210C
Copyright © 2001, 2004 ARM Limited. All rights reserved.
B-5
Scan chain 2
Scan chain 2 enables access to the EmbeddedICE-RT logic registers. See
Test data
registers
on page B-14 for details.
B.1.2
TAP state machine
The process of serial test and debug is best explained in conjunction with the JTAG state
machine. Figure B-2 shows the state transitions that occur in the TAP controller.
Figure B-2 Test access port controller state transitions
From IEEE Std 1149.1-1990. Copyright 1999 IEEE. All rights reserved.
Test-Logic Reset
0xF
Run-Test/Idle
0xC
Select-DR-Scan
0x7
Capture-DR
0x6
Capture-IR
0xE
Shift-DR
0x2
Shift-IR
0xA
Exit1-DR
0x1
Exit1-IR
0x9
Pause-DR
0x3
Pause-IR
0xB
Exit2-DR
0x0
Exit2-IR
0x8
Update-DR
0x5
Update-IR
0xD
Select-IR-Scan
0x4
tms=1
tms=0
tms=0
tms=1
tms=1
tms=1
tms=0
tms=0
tms=1
tms=0
tms=1
tms=1
tms=1
tms=0
tms=0
tms=1
tms=1
tms=1
tms=0
tms=1
tms=0
tms=0
tms=1
tms=0
tms=1
tms=1
tms=0
tms=1
tms=0
tms=0
tms=0
tms=0
Содержание ARM7TDMI
Страница 6: ...Contents vi Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 10: ...List of Tables x Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 14: ...List of Figures xiv Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 46: ...Introduction 1 26 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 120: ...Coprocessor Interface 4 18 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 142: ...Debug Interface 5 22 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 276: ...Differences Between Rev 3a and Rev 4 C 6 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Страница 282: ...Glossary Glossary 6 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...