Agilent Technologies B1542A, Руководство пользователя

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Agilent B1542A User’s Guide, Edition 4 5- 17
PLSDIV Test Definitions
PLSDIV IdVd
PLSDIV IdVd
This test definition controls SMU (source monitor unit) to force the drain voltage,
controls PGU (pulse generator) to force the gate voltage pulse, controls the
oscilloscope to monitor the gate voltage and the drain voltage, calculates the drain
current, and displays the Id-Vd characteristics.
Figure 5-2 Pulsed IV Id-Vd Measurement Result Example
Device Parameters The following parameters are available to set the test condition.
Polarity Polarity of source output. Nch (force the specified value) or Pch
(force the negative specified value). See “Parameters” on page
5-31.
Lg Gate length, in m.
≥
1 nm, 4 digits or 1 nm resolution.
Wg Gate width, in m.
≥
1 nm, 4 digits or 1 nm resolution.
Temp Temperature, in degree. 4 digits or 0.001 degree resolution.
IdMax Maximum drain current measurement range, in A. 0 to 80 mA,
4 digits or 1
μ
A resolution.
DeviceDelay Delay time caused by device under test, in s.
-
1
μ
s to 1
μ
s,
4 digits or 100 ps resolution. See “Parameters” on page 5-31.
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