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8560EC
Series
Spectrum
Analyzer
Midrange Spectrum Analyzers, 8560EC Series (cont.)
Signal Analysis
English URL
www.agilent.com/find/products
Accurate and Easy-to-Use Power Measurements
Using the 8560EC Series Spectrum Analyzers
Many wireless communications systems employ burst-carrier tech-
niques such as time division multiple access (TDMA) and time division
duplex (TDD) to maximize system capacity. The 8560EC series
spectrum analyzers offer power measurements for both continuous
and burst signals that are accurate, and easy to make. Measurement
capability includes adjacent channel power (ACP), carrier power,
channel power, and occupied bandwidth. These analyzers provide the
greatest measurement flexibility and RF performance, making them
powerful tools for R&D designers working with current wireless stan-
dards, or on systems with standards still under development.
The 8562EC Spectrum Analyzer
The 8562EC Spectrum Analyzer was designed specifically for digital
communications. Its frequency coverage of 13.2 GHz means that now
you can use the same analyzer for harmonic and spurious testing
both in- and out-of-band. The increased dynamic range and third-
order intercept (TOI) capability allows wireless communications
engineers to test high-performance components in burst operation
systems. See page 111 for details.
Measurement Utility Increases Speed and Repeatability
The 85672A Spurious Response Measurements Utility makes mea-
surements fast and easy with the touch of a button. Works on all
8560EC series spectrum analyzers. See page 111 for details.
Adjacent Channel Power
The ability to measure ACP on wireless telephones, pagers, and
other transmitters is critical in R&D, manufacturing and in the field.
The 8560EC series spectrum analyzers provide ACP measurements
for a variety of wireless communication systems, including support
for NADC-TDMA, PDC, and PHS digital formats. Many of the
implementation difficulties of the established standards have been
addressed, providing fast, accurate, and easy-to-use ACP measure-
ments. Use an 8560EC series spectrum analyzer with the 8563EC-
K35 APCR test set to meet the needs of the W-CDMA specifications.
In addition to the standard analog method for making ACP
measurements (used for FM mobile telephones and continuous digi-
tal formats), the analyzers support four other methods used for
burst-carrier measurements of TDMA and TDD signals:
• Peak (for PDC and PHS)
• Two-bandwidth (for PDC)
• Time-gated (for NADC-TDMA)
• Burst-power (an Agilent proprietary method)
The burst-power method overcomes many of the problems of
the other standards, and is suitable for all formats. These methods
can easily be adapted to measure other transmitters besides those
used for cellular or cordless telephones. Configuration parameters
that can be set by the user include channel spacing and bandwidth,
number of alternate channels, burst period and width, and values for
root-raised-cosine frequency weighting. Measurement results can be
displayed in both graphic and tabular formats for ease of data inter-
pretation and documentation. Measurement accelerators are avail-
able that give ACP results in just a few seconds, allowing real-time
transmitter adjustments.
Carrier Power
The carrier power feature provides the user with a quick means of
measuring the average “on” and “off” power of the burst carrier. This
measurement is performed in the time domain, using zero span.
Channel Power
The channel power feature quickly provides the user with informa-
tion on total power within a specified channel bandwidth, as well
as power density within the channel. This feature greatly simpli-
fies this common measurement, as the spectrum analyzer auto-
matically performs the necessary integration across the desired
frequency band.
Occupied Bandwidth
Occupied bandwidth is a way of determining the spectral spread of
a signal. It is defined as the bandwidth which contains the specified
percent of the total transmitted power. The user may specify the per-
centage to be anywhere from 0.1 to 99.99 percent.
Burst Timing
Complete timing measurements can be made on the burst-carrier
signal using digitized, fast time-domain (zero span) sweeps. Using
sweep times as fast as 50 µs, edge times, burst width, and time
between bursts can easily be measured.
More Information
More information about the 8560EC series spectrum analyzers,
including ordering information, can be found on page 110.
• Accurate, automated ACP measurements on TDMA and TDD signals
• Measure according to NADC-TDMA, PDC, PHS, and other
standards
• Measurement accelerators speed up ACP testing
• Carrier on/off power
• Total channel power, percent occupied bandwidth
• Burst-timing measurements
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