OPERATION
Axioskop 2 FS
plus
Carl Zeiss
Quantitative microscopy
Axioskop 2 FS
MOT
3-38
B 40-076 e 02/01
After exchange of the stage micrometer for the
specimen to be measured, the measuring distance
of interest results from the number of increments
of the crossline micrometer (tenth estimated),
multiplied by the scale value k’. Example:
L = 35.5 x 9.9 µm = 351.5 µm
Particularly large object structures can also be
determined by using the vernier scale gradations
(0.1 mm) on the mechanical stage. Here, it might
be necessary to determine the distance to be
measured through calculation from a combined x
and y measurement (Pythagoras).
3.5.2
Height measurement
Height measurements using the microscope are always possible to be performed if both the lower and
upper side of the specimen can be focused. This should preferably be performed using a precision
focusing drive and a high-aperture objective with a low depth of focus.
The difference in the height of the objective slider results in a height value for transmitted-light
specimens which is falsified by the refractive index of the specimen (through which focusing was made)
and perhaps by the immersion oil. The correct height value d of the specimen measured in transmitted
light results from the difference of height adjustments (focus difference) d’ and the refractive indices n
P
of the specimen and n
M
of the medium between cover slip and specimen:
d = d’ x
Fig. 3-26
Length measurement using scale 1
on the stage micrometer (object)
and scale 2 on the crossline
micrometer (eyepiece)
n
P
n
M
1
2
Summary of Contents for Axioskop 2 FS plus
Page 1: ...Operating Manual Axioskop 2 FS plus FS MOT Research Microscope...
Page 14: ...INTRODUCTION Axioskop 2 FS plus Carl Zeiss Axioskop 2 FS MOT 0 14 B 40 076 e 02 01...
Page 110: ...OPERATION Axioskop 2 FS plus Carl Zeiss Axioskop 2 FS MOT 3 40 B 40 076 e 02 01...
Page 122: ...ANNEX Axioskop 2 FS plus Carl Zeiss Axioskop 2 FS MOT A 2 B 40 076 e 02 01...
