The Recovered Clock Wander Measurements features can usually be found within the test options that the intended technology
offers.
In 1GE and 10GE test modes, the Wander Measurement function may be found under the Advanced Tools menu,
provided that SyncE or 1588v2 slave modes have been enabled.
In PDH test modes, the wander measurement function may be found in >PDH Tools >Jitter & Wander >Wander.
In SDH/SONET test modes, the wander measurement function may be found in >SONET/SDH Tools >Jitter & Wander
>Wander.
In DSn test modes, the wander measurement function may be found in >DS1/DS3 Tools >DS1/3 Jitter & Wander
>Wander.
In CPRI Layer 2 Framed test mode, the wander measurement function may be found in its dedicated Wander menu,
provided that the test set is configured as a CPRI slave.
Test Setup
Setup
Measurement Clock Reference
or Reference Clock Source offers a selection of external or internal (optional) frequency
references. Internal or built-in reference options could be “Atomic 10 MHz” or “Atomic 1PPS”, disciplined by GPS or free
running.
External Clock Type
allows users to select from a list of supported clock signals (e.g. 1.544 MHz, 2.048 MHz, 1544
Mbps, 10 MHz, 2.048 Mbps, 1PPS). The traceable external clock reference source of choice shall be connected to the
CLK (SMA) port. Avoid using rigid BNC-to-SMA adapters to prevent any stress on the test set’s connector. Flexible
adapters or cables are recommended.
Test Mode
lets user select between Manual start/stop and Timed measurements. If Timed is selected, users can set the
length of the test in seconds, minutes, hours or days. Once the selected time has elapsed the test automatically stops.
Save TIE
can be turned ON to write all wander measurements to a FAT32 USB Memory stick in real time, to be analyzed
later on.
The
Sampling Rate
(samples per second) can be set to 1/s, 5/s, 10/s or 30/s, depending on the application. 30/s is
recommended.
Filename
identifies the new folder in which all configuration and measurement data will be stored. This folder will be
created in the root of the memory stick.
Tap on the Start button to initiate the measurements and data logging.
Tap on the Stop button to force the measurement and data logging to stop. This will also stop a Timed test, even if the
total time has not finished yet.
After stopping the test, and if the built-in MTIE/TDEV option is enabled, users can also tap on the Analysis button to view
the TIE graph and perform the MTIE/TDE analysis on the recorded TIE data. Refer to the following sections for more
details.
Users may also be allowed to perform run-time MTIE/TDEV analysis with all the data collected up to that point, without
having to stop an ongoing long-term wander test.
Test Result
RXT-3900 e-Manual D07-00-111P Rev A00
Summary of Contents for RXT3900
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