© 2006 - 2008 TOSHIBA TEC CORPORATION All rights reserved
e-STUDIO165/167/205/207/237
ERROR CODE AND SELF-DIAGNOSTIC MODE
2 - 93
2
[G] 07. CLOCK IC TEST
After programming the fixed date and time on the clock IC, the test reads the programmed date and
time and checks whether or not they are correct.
Fig. 2-12
[H] 08. SCANNER TEST
The read/write test is performed on the RAM built in the image processing LSI.
Fig. 2-13
Power ON
1
3
Cancel
ENTER
<Key used in operation>
<Display messages>
Select test menu
07.CLOCK IC TEST
or
Power ON
1
3
Cancel
<Key used in operation>
<Display messages>
Select test menu
08.SCANNER TEST
or
ENTER
06/09
Summary of Contents for e-STUDIO165
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