HP 85106D, Manual

Page: 70 / 244

HP 85106D mm-Wave System 2-25
Operation
1-Port Calibration
3. Connect the quarter-wave offset shim between the test port and the flush
short to make a quarter-wave offset short. Press {
OFFSET
} and wait for
this measurement to be completed.
4. Press {
LOADS
}, then choose either {
FIXED
}, {
OFFSET
}, or {
SLIDING
}.
a. Fixed Load Only - Connect the load and select {
FIXED
}. When the
measurement is complete press {
DONE LOADS
}.
b. Offset Load- Select {
OFFSET
} and the two load selections appear,
{
LOAD NO OFFSET
}{
LOAD OFFSET
}. Connect the fixed load directly to
the test port and press {
LOAD NO OFFSET
}. After the measurement
insert the quarter-wave waveguide
s
ection between the test port and
the fixed load. Press {
LOAD OFFSET
}. When the measurement is
complete, press {
OFFSET LOAD DONE
} {
DONE LOADS
}.
c. Sliding Load - (not available for V and W bands). Select {
SLIDING
}.
Connect the sliding load and move the sliding element toward the
test port then press {
SLIDE IS SET
}. After the measurement, change the
position of the sliding load and press {
SLIDE IS SET
} again. Change
the load position at least five more times covering the full range of
possible positions. Press {
SLIDING LOAD DONE
}.
5. Press {
SAVE 1-PORT CAL
}. The error coefficients are computed and the Cal
Set selection menu is displayed. Press one of the {
CAL SET
} keys to store
the error coefficients and turn on correction. The system is now ready for
fully error-corrected reflection measurements of one-port devices.
Combining
Calibration Error
Models
Another technique for measuring 2-port devices is to combine an S
11
, 1-port
calibration and an S
21
thru Response calibration for the forward parameters.
Then combine an S
22
1-Port calibration and an S
12
thru Response calibration
for the reverse parameters. With this technique each parameter has its own
cal set and is measured independently of the other parameters. This is
usually the fastest way to measure a two-port device, but since this technique
does not account for source and load match effects, it is only recommended
for measurements of well matched or high loss devices.