© 2006 Cronyx
Section 4. Management over Console Port
4.7. "Test" Menu
"
Test
" menu is designed for managing BER tester:
Bit Error Test
Time total: 00:00:00
Sync loss: 00:00:00
Bit errors: 0
Error rate: Testing disabled
1. Testing: Disabled
2. Error insertion rate: No errors inserted
3. Insert single error
4. Test pattern: Pseudo-random
<C> - clear errors counter, <R> - refresh mode, <Enter> - exit_
Screen information is updated once per two seconds. To return to upper level menu,
you must press <Enter> (or <Return>). Press “R” to toggle screen refresh mode between
overlapping and redraw. In overlapping mode the screen will not be cleared when infor-
mation is updated. To reset statistics counters to zero, press “C”.
"Testing: ...”
command enables or disables data test pattern generation (switches from
"Disabled" state to "Enabled" and back).
"Error insertion rate: ...”
command selects error insertion rate, from 10
-7
to 10
-1
er-
rors/bit, or disables error insertion mode, in this case "No errors inserted" message is
displayed in place of numeric value.
"Insert single error"
command inserts single error.
"Test pattern: ...”
command allows using either pseudo-random code as a test pattern,
or selecting fixed 8 bit code.
Test results information is displayed in the following lines:
•
"Time total: ...”
– total test time;
•
"Sync loss: ...”
– time during which test pattern synchronization was lost;
•
"Bit errors: ...”
– bit error counter;
•
"Error rate: ...”
– error rate in the received data, from 10
-1
to 10
-8
. If testing is not en-
abled, "Testing disabled" message is displayed in this field, if no test pattern is detected
in the received data, the "Test pattern not detected" message is shown.
Error rate measurement device modes are not saved in nonvolatile memory.
Summary of Contents for FMUX/SAT
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