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280
Chapter 7 Tutorial
Measurement Fundamentals
Loading Errors Due to Input Bias Current
The semiconductor
devices used in the input circuits of the internal DMM have slight
leakage currents called
bias currents
. The effect of the input bias current
is a loading error at the internal DMM’s input terminals. The leakage
current will approximately double for every 10 °C temperature rise, thus
making the problem much more apparent at higher temperatures.
Where:
I
b
= DMM bias current
R
s
= DUT source resistance
R
i
= Input resistance (10 M
or > 10 G
)
C
i
= DMM input capacitance
Error (V) =
I
b
X R
s
V
s
DMM
R
s
HI
LO
R
i
C
i
I
b
34970A Refresh UG.book Page 280 Wednesday, February 17, 2010 12:34 PM
Summary of Contents for 34970A
Page 16: ...16 34970A Refresh UG book Page 16 Wednesday February 17 2010 12 34 PM ...
Page 20: ...34970A Refresh UG book Page 20 Wednesday February 17 2010 12 34 PM ...
Page 21: ...1 1 Quick Start 34970A Refresh UG book Page 21 Wednesday February 17 2010 12 34 PM ...
Page 39: ...2 2 Front Panel Overview 34970A Refresh UG book Page 39 Wednesday February 17 2010 12 34 PM ...
Page 59: ...3 3 System Overview 34970A Refresh UG book Page 59 Wednesday February 17 2010 12 34 PM ...
Page 87: ...4 4 Features and Functions 34970A Refresh UG book Page 87 Wednesday February 17 2010 12 34 PM ...
Page 217: ...5 5 Error Messages 34970A Refresh UG book Page 217 Wednesday February 17 2010 12 34 PM ...
Page 241: ...6 6 Application Programs 34970A Refresh UG book Page 241 Wednesday February 17 2010 12 34 PM ...
Page 254: ...254 34970A Refresh UG book Page 254 Wednesday February 17 2010 12 34 PM ...
Page 255: ...7 7 Tutorial 34970A Refresh UG book Page 255 Wednesday February 17 2010 12 34 PM ...
Page 324: ...324 34970A Refresh UG book Page 324 Wednesday February 17 2010 12 34 PM ...