Toshiba SATELLITE M40 Series, Руководство по обслуживанию

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3.6 Memory Test 3 Diagnostic Programs
Satellite M40/M45 TECRA A4 Dynabook Vx/4 Maintenance
Manual 39
The test item is to ensure that there is no short circuitry issue in memory chip. The
parameter dialog window is the same as that in ‘Subtest 02 Pattern’.
Subtest 05 Walking 0’s Test
The test item is to ensure that there is no open circuitry issue in memory chip. The
parameter dialog window is the same as that in ‘Subtest 02 Pattern’.
Subtest 06 Memory Address
This test item is to check short and open issue on memory address lines .
Subtest 07 Refresh Test
This test item is to check whether the memory refresh works normally. The
parameter dialog window is as follows:
Subtest 08 Cache Memory
The test item is to check whether the CPU internal cache memory could be
accessed correctly.
Subtest 09 Random Memory
Random Memory test includes the following two test items: Randomize Test and
Random Incremental Read/Write Test. The parameter dialog window is the same
as that in ‘Subtest 03 Extended Pattern’.
1. Randomize Test
This test item is to check whether the memory could be correctly accessed
with randomized data and randomized memory address.
2. Random Increment Read/Write