Toshiba SATELLITE M40 Series, Руководство по обслуживанию

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3.6 Memory Test 3 Diagnostic Programs
Satellite M40/M45 TECRA A4 Dynabook Vx/4 Maintenance
Manual 37
test coverage would be based on the setting and the value in ‘Percent (%)
mentioned at below.
Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.
Percent (%): Choose the percentage of the defined range of the memory to
be tested.
Time Limit(h): Choose or Input the time (hour) of the defined range of the
memory to be tested.
Time Limit(m): Choose or Input the time (minute) of the defined range of
the memory to be tested.
1. Bit Stuck High Test
Data pattern: Every bit is ‘1’ (Each bit is high)
2. Bit Stuck Low Test
Data pattern: Every bit is ‘0'(Each bit is low);
3. Checker Board Test
Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010
(0xA);
4. CAS Line Test
Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and
1111(0xF);
5. Incremental Test
Data pattern: A series of increasing data from 0 by adding 1 each time;
6. Decrement Test
Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by
subtracting 1 each time;
7. Incremental / Decrement Test
Data Pattern is a series of data whose low byte is increasing data from 0x00
and high byte is decreasing data from 0xFF.
Subtest 03 Extended Pattern