Tomey TMS-5, Инструкция по эксплуатации, Страница: 182 / 216

4-2
4.3 Refractive power correction by analysis of capturing
in slit mode
Images captured in slit mode are affected by distortion
due to the optical system for capturing and optical
characteristics of the inspected eye. This influence needs
to be considered during analysis in order to calculate the
dimensions of the anterior chamber.
To counter distortion due to the optical system for
capturing, a reference pattern has been captured in the
manufacturing process of the instrument and the distortion
is calculated, using the magnification and distortion of the
reference pattern recognized by the captured image.
To counter the influence of refraction due to the optical
characteristics of the inspected eye, the influence level on
the captured image is analyzed by tracing the beam using
curvature at each point on the measured anterior chamber
shape, and the shape of the inside of an eye is calculated.
4.4 Axial direction and symbol of alignment and pupil offset
„
Note that the symbol for the Y Offset of the pupil is
reversed from the indication of the TMS-2, 3, and 2N
software.
The alignment offset (lower right of the map screen) and
pupil offset (lower left of the map screen) are displayed
in mm, with the axial directions and symbols defined as
follows:
X axis: Looking at the patient's eyes from the physician,
the right hand side is positive.
Y axis: Looking at the patient's eyes from the physician,
the upper side is the positive.
Z axis: Looking at the physician from the patient’s eye, the
physician side is positive.