Rigaku 2080A211, Инструкция по эксплуатации

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Cross beam optics(CBO)
CBO is an optical system which easily switches between the divergent beam used in measurements in para-focusing
optics and the parallel beam conditioned by multilayer mirror, by replacing the selection slits. As shown in the
diagram, selection slit (BB) uses x-rays passing through optical path A, while selection slit (PB) uses x-rays passing
through optical path B. In SmartLab, the multilayer mirror is designed so that optical path A and optical path B
intersect at the center (goniometer center) of the sample at a distance of 300 mm from the x-ray focal point. There is
no need to remove the multilayer mirror when switching from parallel beam optics to para-focusing optics. Simply
change the selection slits and perform 2-theta axis adjustment one time.
Switching between para-focusing optics and parallel beam optics by changing selection slits
CBO-E keeps the CBO feature which makes the optical paths A and B intersect on the sample. The only difference
is that the shape of the multilayer mirror used in the CBO-E unit is ellipsoidal while the mirror shape used for CBO
is parabolic.
The ellipsoidal multilayer mirror used in CBO-E has been designed so that one focus of the ellipsoid is placed at the
focus of the x-ray source and the other focus of the ellipsoid falls on the detector plane. When measuring capillary
samples or samples on the transmission SAXS sample plate in the transmission geometry, the measurement can be
performed very efficiently if a 1D detector like D/teX Ultra is used in combination. The CBO-E unit also switches
between measurements in the reflection geometry in para-focusing optics and those in the transmission geometry in
convergent optics. In both cases, D/teX Ultra enables very efficient measurements.
Diagram of the optics using CBO-E
選択スリット(
PB
)
光路
B
（平行ビーム）
試料 X
線源（フィラメント）
Optical path B (parallel beam)
Sample
X-ray source
Selection slit (PB)
選択スリット(
BB
)
光路
A
（発散ビーム）
X
線源（フィラメント）
試料
X-ray source
Sample
Optical path A (divergent beam)
Selection slit (BB)
X-ray source
Selection slit (CB)
Sample
Detector position
Optical path B (convergent beam)
Optical path A (divergent beam)