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Chapter 35 IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5606BK Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor
951
35.8.3.1
Selecting an IEEE 1149.1-2001 register
Access to the JTAGC data registers is done by loading the instruction register with any of the JTAGC
instructions while the JTAGC is enabled. Instructions are shifted in via the select-IR-scan path and loaded
in the update-IR state. At this point, all data register access is performed via the select-DR-scan path.
The select-DR-scan path is used to read or write the register data by shifting in the data (LSB first) during
the shift-DR state. When reading a register, the register value is loaded into the IEEE 1149.1-2001 shifter
during the capture-DR state. When writing a register, the value is loaded from the IEEE 1149.1-2001
shifter to the register during the update-DR state. When reading a register, there is no requirement to shift
out the entire register contents. Shifting can be terminated after fetching the required number of bits.
35.8.4
JTAGC instructions
This section gives an overview of each instruction, refer to the IEEE 1149.1-2001 standard for more
details.
The JTAGC implements the IEEE 1149.1-2001 defined instructions listed in
.
35.8.4.1
BYPASS instruction
BYPASS selects the bypass register, creating a single-bit shift register path between TDI and TDO.
BYPASS enhances test efficiency by reducing the overall shift path when no test operation of the MCU is
required. This allows more rapid movement of test data to and from other components on a board that are
required to perform test functions. While the BYPASS instruction is active the system logic operates
normally.
Table 35-3. JTAG instructions
Instruction
Code[4:0]
Instruction Summary
IDCODE
00001
Selects device identification register for shift
SAMPLE/PRELOAD
00010
Selects boundary scan register for shifting, sampling, and preloading
without disturbing functional operation
SAMPLE
00011
Selects boundary scan register for shifting and sampling without disturbing
functional operation
EXTEST
00100
Selects boundary scan register while applying preloaded values to output
pins and asserting functional reset
ACCESS_AUX_TAP_ONCE
10001
Grants the PLATFORM ownership of the TAP
Reserved
10010
—
BYPASS
11111
Selects bypass register for data operations
Factory Debug Reserved
1
1
Intended for factory debug, and not customer use
00101
00110
01010
Intended for factory debug only
Reserved
2
2
Freescale reserves the right to change the decoding of reserved instruction codes
All other codes
Decoded to select bypass register
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