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Chapter 30 Flash Memory
MPC5606BK Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor
851
30.5.2.7
DFlash User Test 1 register (DFLASH_UT1)
The DFLASH_UT1 register allows to enable the checks on the ECC logic related to the 32 LSB of the
double word.
The User Test 1 Register is not accessible whenever DFLASH_MCR[DONE] or DFLASH_UT0[AID] are
low: reading returns indeterminate data while writing has no effect.
30.5.2.8
DFlash User Test 2 register (DFLASH_UT2)
The DFLASH_UT2 register allows to enable the checks on the ECC logic related to the 32 MSB of the
double word.
The User Test 2 Register is not accessible whenever DFLASH_MCR[DONE] or DFLASH_UT0[AID] are
low: reading returns indeterminate data while writing has no effect.
Address offset: 0x00040
Access: Read/write
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
R
DAI[31:16]
W
Reset
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
R
DAI[15:0]
W
Reset
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Figure 30-34. DFlash User Test 1 register (DFLASH_UT1)
Table 30-50. DFLASH_UT1 field descriptions
Field
Description
DAI[31:16]
Data Array Input, bits 31-0
These bits represent the input of even word of ECC logic used in the ECC logic check. Bits DAI[31:00]
correspond to the 32 array bits representing Word 0 within the double word.
0 The array bit is forced at 0.
1 The array bit is forced at 1.
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