Chapter 35 IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5606BK Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor
949
35.7.4
Boundary scan register
The boundary scan register is connected between TDI and TDO when the EXTEST, SAMPLE or
SAMPLE/PRELOAD instructions are active. It is used to capture input pin data, force fixed values on
output pins, and select a logic value and direction for bidirectional pins. Each bit of the boundary scan
register represents a separate boundary scan register cell, as described in the IEEE 1149.1-2001 standard
and discussed in
. The size of the boundary scan register is 464 bits.
35.8
Functional description
35.8.1
JTAGC reset configuration
While in reset, the TAP controller is forced into the test-logic-reset state, thus disabling the test logic and
allowing normal operation of the on-chip system logic. In addition, the instruction register is loaded with
the IDCODE instruction.
35.8.2
IEEE 1149.1-2001 (JTAG) Test Access Port
The JTAGC uses the IEEE 1149.1-2001 TAP for accessing registers. This port can be shared with other
TAP controllers on the MCU. For more detail on TAP sharing via JTAGC instructions refer to
Section 35.8.4.2, ACCESS_AUX_TAP_x instructions
Data is shifted between TDI and TDO though the selected register starting with the least significant bit, as
illustrated in
. This applies for the instruction register, test data registers, and the bypass
register.
Figure 35-4. Shifting data through a register
35.8.3
TAP controller state machine
10–19
PIN
Part identification number. Contains the part number of the device. For the MPC5606BK, this value is
0x244.
20–30
MIC
Manufacturer identity code. Contains the reduced Joint Electron Device Engineering Council (JEDEC) ID
for Freescale, 0xE
31
ID
IDCODE register ID. Identifies this register as the device identification register and not the bypass
register. Always set to 1.
Table 35-2. Device identification register field descriptions
Field
Description
Selected register
MSB
LSB
TDI
TDO
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