Mitsubishi MELSEC-WS series, Руководство пользователя

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Chapter 3
34
Product description
3.8 WS0-XTIO safety I/O combined module
3.8.1 Description
The WS0-XTIO module is an input/output extension with 8 safe inputs and 4 safe
outputs. It has two test signal generators: One for test output X1 and one for test
output X2.
 The WS0-XTIO module offers the following functions:
 Monitoring of the connected safety devices, also refer to Chapter 4.
 Passing on the input information to the CPU module
 Receiving the control signals from the CPU module and corresponding switching of
the outputs
 Fast shut-off: Direct shut-down of the actuators connected to the module possible
from firmware version V1.11.0 on the CPU module CPU0 or CPU1 as well as with
all firmware versions on the CPU module CPU3. Version V1.2.0 or later of the
Setting and Monitoring Tool required for this purpose.
This feature significantly reduces the response time of the overall system. For
switching off outputs, only 8 ms have to be added to the response times of the
devices connected to the inputs and outputs. The response time on the
backplane bus as well as the logic execution time are irrelevant in this case. See
also Section 12.1.
 Enabling or disabling of test pulses for outputs Q1 to Q4 with firmware version
V2.00.0 or higher and Setting and Monitoring Tool version V1.3.0 or higher.
The WS0-XTIO module cannot be used alone and always requires a WS0-CPU0 or
WS0-CPU1 module. See the Safety Controller Setting and Monitoring Tool Operating
Manual.
The simultaneous use of several WS0-XTIO modules is possible, see Section 3.2.
Voltage for the internal logic and the test outputs is supplied from the memory plug via
the backplane bus.
Voltage for the WS0-XTIOs outputs Q1…Q4 must be supplied directly via A1/A2 on
the respective module.
 Short-circuits between test signal generators on MELSEC-WS safety controller I/O
module are detected, also between test signal generators on different modules,
provided the test gaps are
≤ 4 ms and the test periods are ≥ 200 ms for the relevant
test outputs.
 Short circuits to 24 V DC (stuck at high) at inputs connected to test outputs are
detected independently of the test gap time.
Note