Keysight PD1000A Power Device Measurement System Startup Guide
53
Running the IV and CV Tests
IV and CV Device Characterization
– Temperature Trigger:
a
Enter the temperature(s) you want tested in the temperature field,
separated by semicolons (;).
b
Finish selecting tests and setting up the device parameter information for
each test, as described in this chapter.
c
Manually heat the test chamber to more than the highest value you
entered and then stop heating the chamber. When you start the test (as
described below), the software automatically triggers measurements when
the test chamber cools to each value that you entered.
– Manual:
Use this option if you have your own thermal control solution or if
you do not plan to use a thermal platform.
If you do not have your own thermal control solution:
a
Enter a single value for the temperature at which you want to run the test.
b
Finish selecting tests and setting up the device parameter information for
each test, as described in this chapter.
c
Use your thermal controller to heat the test chamber to the temperature
value you entered.
d
When the chamber reaches the correct temperature, run the test manually
as described below.
e
Repeat this procedure to run additional tests at different temperatures, as
needed.
-- If you do not have a thermal platform:
a
Enter the average temperature of the room in which you perform the tests.
(If you don't know the average temperature, use 25 °C as a typical value.)
b
Finish selecting tests and setting up the device parameter information for
each test, as described in this chapter.
c
Run the test manually as described below.
4
Select the checkbox for each test that you want to run. (Available tests
depend on the DUT type and the type of SMU available. Refer to the control
This method takes longer (on the order of hours) because of the time
required for the test chamber to cool between each measurement.
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