IBM 7015-R30, Инструкция по установке и обслуживанию

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SystemGuard Test Groups
A-1
Appendix A. SystemGuard Test Groups
SystemGuard Test Groups Table
The following diagram shows the various test groups and their associated tests. To modify
the test list, the tests have to be selected in the
xxyy format, where xx is the group number
and yy is the test number within the group. For example, enter
0106
to specify the
NVRAM
test in the
BUMP Quick IO
test group.
GROUP NO GROUP TEST NO TEST
01 BUMP quick IO test
group 01
02
03
04
05
06
07
08
09
10
11
12
13
50
51
52
53
54
Debug Line Test
S1 ASL (BUMP) Test
S2 ASL (REM.) Test
S3 ASL (SPE.) Test
Flash EPROM Content Test
NVRAM Content Test
Eprom Content Test
TOD Test
Floppy Disk controller Test
BPP Registers Test
Misc. register Test
CPU access Test
VPD Coherency Test
Asynch. lines L–B Test (*)
BPP Ext. L–B Full Test (**)
Printer Test
Dial–Out Test
BPP Ext. L–B Test (*)
02 JTAG test group 01 JTAG Chain Integrity Test
03 Direct IO test group 01
02
03
04
05
06
07
50
IONIAN – SSGA reg. Test
NVRAM access Test
Super–IO access Test
Flash access Test
Eprom access Test
TOD access Test
IONIAN2 Regs. Test
Floppy Disk Ext. Test
04 CPU test group 01
02
03
04
05 CPU processor Test
Address translation Test
L1 cache Test
L2 cache Test
EEPROM coherency Test