Hioki 3532-50, Инструкция по эксплуатации

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7.3 Time Taken for Testing
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Range Frequency
1
2
3
4
5
6
7
8
9 42 Hz to 99.9 Hz
100.0 Hz to 300.0 Hz
300.1 Hz to 1.000 kHz
1.001 kHz to 3.000 kHz
3.001 kHz to 10.00 kHz
10.01 kHz to 30.00 kHz
30.01 kHz to 100.0 kHz
100.1 kHz to 1.000 MHz
1.001 MHz to 5.000 MHz
Range Test signal level
1
2
3
4 0.010 V to 0.100 V
0.101 V to 0.500 V
0.501 V to 1.000 V
1.001 V to 5.000 V
Wait time for changing test conditions
When the test conditions are changed, the time taken for the internal
processing is necessary according to the following factors (1) to (3), before
testing.
(1) When the test frequency is changed:
Changing to the frequency in another range Wait time: 300 ms
(2) When the test signal level is changed:
Changing to the test signal level in another range Wait time: 300 ms
Note When the test signal level setting is CV/CC or the setting of
voltage and current limit is ON, the test signal level is
automatically changed.
(3) When the test range is changed:
Wait time: 300 ms