Hioki 3532-50, Инструкция по эксплуатации

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7.3 Time Taken for Testing
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NOTE
Tf(s) = 1/ test frequency
Test frequency [Hz]
Calculation time (Allowance 2 ms)
FAST NORM SLOW SLOW2
42.0 to 99.9 Tf Tf x 4 Tf x 8 Tf x 16
100.0 to 300.0 Tf Tf x 16 Tf x 32 Tf x 64
300.1 to 1.000 k Tf Tf x 16 Tf x 64 Tf x 128
1.001 k to 3.000 k Tf Tf x 32 Tf x 128 Tf x 256
3.001 k to 30.00 k 10 ms 160 ms 320 ms 640 ms
30.01 k to 5.000 M 1 ms 16 ms 64 ms 128 ms
<A>
The time taken for calculation varies according to the display parameters:
Test frequency [Hz]
Calculation time (Allowance 2 ms)
FAST NORM SLOW SLOW2
42.0 to 99.9 8 ms 10 ms 12 ms 16 ms
100.0 to 300.0 5 ms 7 ms 9 ms 14 ms
300.1 to 1.000 k 4 ms 5 ms 8 ms 12 ms
1.001 k to 3.000 k 4 ms 5 ms 7 ms 10 ms
3.001 k to 30.00 k 5 ms 7 ms 9 ms 14 ms
30.01 k to 5.000 M 5 ms 6 ms 8 ms 12 ms
7.3 Time Taken for Testing
The time taken for testing varies according to the test conditions.
The following values may be used for reference.
These values are all for reference only. Do not rely upon them absolutely,
because the actual time taken for testing depends upon many operational
conditions.
Analog testing signal (INDEX)
The output time (T3) of the analog testing signal (INDEX) taken according
to the testing speed:
Testing finished signal (EOM)
For the output time (T4) of the testing finished signal (EOM), the following
time periods A through E should be added to the output time of the analog
testing signal <T3>:
T4 = T3+A+B+C+D+E
The time taken for calculation varies according to A to E.