Associated Research OMNIA II 8204, Руководство по эксплуатации и обслуживанию

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From the Leakage Current Parameter setting screen, the following parameters may
be controlled: Leakage-HI, Leakage-LO, Voltage-HI, Voltage-LO, Dwell Time, Delay
Time, Offset, Leakage, Active Link, Step Name, Scanner Channel, Defaults and More.
Pressing the More key will bring up additional parameters: Reverse, Neutral, Ground,
Measuring Device and Probe. Pressing the More soft key again will bring up additional
parameters: AC Source, AC/DC, Select Meter, and Ranging Mode.
Leakage-HI : The maximum leakage current allowable through the measuring device
that triggers a failure when exceeded.
Leakage-LO : The minimum leakage current allowable through the measuring device
that triggers a failure when not exceeded.
Offset : The offset of leakage current measurements taken during a line current test.
The purpose of the LLT Offset is to allow the unit to zero out leakage current
associated with instrument, the instrument leads and any other integrated Associated
Research, Inc. instruments. Since there is a capacitive value associated with the
Associated Research Inc. instruments, leakage current due to this capacitance factors
into the total leakage value displayed during a line current test.
The Omnia II applies a formula for taking an offset into account:
Displayed Current = √((Total Leakage Current)^2 – (Offset Current)^2)
The “Total Leakage Current” is the measure of the total leakage current on the system
including the Omnia II, other integrated Associated Research, Inc. instruments and the