Test Support
10-2
Copyright © ARM Limited 2000. All rights reserved.
10.1 About the ARM946E-S test methodology
To achieve a high level of fault coverage, you can use scan insertion and ATPG
techniques on the ARM9E-S core and ARM946E-S control logic as part of the synthesis
flow. You can use BIST to provide high fault coverage of the compiled SRAM.
Содержание ARM946E-S
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