Debug Support
Copyright © ARM Limited 2000. All rights reserved.
8-9
8.3.4
Public instructions
Table 8-1 lists the public instructions that are supported.
In this section it is assumed that TDI and TMS are sampled on the rising edge of TCK
and all output transitions on TDO occur as a result of the falling edge of TCK.
EXTEST (0000)
The selected scan chain is placed in test mode by the EXTEST instruction. The
EXTEST instruction connects the selected scan chain between TDI and TDO.
When the instruction register is loaded with the EXTEST instruction, all the scan cells
are placed in their test mode of operation.
In the CAPTURE-DR state, inputs from the system logic and outputs from the output
scan cells to the system are captured by the scan cells.
In the SHIFT-DR state, the previously captured test data is shifted out of the scan chain
on TDO, while new test data is shifted in on the TDI input. This data is applied
immediately to the system logic and system pins.
SCAN_N (0010)
This instruction connects the scan path select register between TDI and TDO.
During the CAPTURE-DR state, the fixed value 10000 is loaded into the register.
Table 8-1 Public instructions
Instruction
Binary code
EXTEST
0000
SCAN_N
0010
INTEST
1100
IDCODE
1110
BYPASS
1111
SAMPLE/PRELOAD
0011
RESTART
0100
Содержание ARM946E-S
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