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MT9T111_DG - Rev. B 9/10 EN
71
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MT9T111: Developer Guide
Walking 1s Test Pattern
Preliminary
Figure 41:
Sample Operation for Multiple Lines with Horizontal Blanking
Procedure
To enter the walking 1s test pattern:
1. Perform the power-on initialization routine.
2. Select the walking 1s test pattern data width by programming register map TX_SS
0x3220[1] to “1” for 10-bit data output and “0” for 8-bit data output mode.
3. Enable the walking 1s test pattern by setting SOC1 0x3290[5:4] to “10.”
4. Select the walking 1s test pattern output from the output multiplexer by program-
ming SOC1 0x321C[3:0] = 0x4.
0x00
0x00
0x01
0x01
0x40
0x00
0x40
0x40
0x40
0x40
0x00
0x00
...
[7:0]
...
...
...
... ...
0x00
0x00
0x01 0x01
... ...
...
0 x40
0x000
0x000
0x001
0x001
0x200
0x000
0x200 0x200
0x200
0x200
0x000
0x000
...
...
...
... ...
0x000 0x000 0 x001 0x001
... ...
...
0x200
...
...
...
...
FV
LV
PIXCLK
D
OUT
[7:0]
FV
LV
PIXCLK
D
OUT
[7:0],
D
OUT
_LSb 1,
D
OUT
_LSb 0
10-Bit Walking 1s Output
8-Bit Walking 1s Output