
Self
Diagnose
Softkey
Y
ou
can
access
the
self
diagnosis
function
by
pressing,
4
SYSTEM
5
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
SERVICE
MENU
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
SELF
DIAGNOSE
.
This
function
examines
,
in
order
,
the
pass/fail
status
of
all
internal
tests
and
displays
NO
FAIL
FOUND
if
no
tests
have
failed.
If
a
failure
is
detected,
the
routine
displays
the
assembly
or
assemblies
most
probably
faulty
and
assigns
a
failure
probability
factor
to
each
assembly
.
T
est
Descriptions
The
analyzer
has
up
to
80
routines
that
test,
verify
,
and
adjust
the
instrument.
This
section
describes
those
tests
.
Internal
T
ests
This
group
of
tests
runs
without
external
connections
or
operator
interaction.
All
return
a
PASS
or
FAIL
condition.
All
of
these
tests
run
on
power-up
and
PRESET
except
as
noted.
0
ALL
INT
.
Runs
only
when
selected.
It
consists
of
internal
tests
3-11,
13-16,
and
20.
Use
the
front
panel
knob
to
scroll
through
the
tests
and
see
which
failed.
If
all
pass
,
the
test
displays
a
P
ASS
status
.
Each
test
in
the
subset
retains
its
own
test
status
.
1
PRESET
.
Runs
the
following
subset
of
internal
tests:
rst,
the
ROM/RAM
tests
2,
3,
and
4;
then
tests
5
through
11,
14,
15,
and
16.
If
any
of
these
tests
fail,
this
test
returns
a
F
AIL
status
.
Use
the
front
panel
knob
to
scroll
through
the
tests
and
see
which
failed.
If
all
pass
,
this
test
displays
a
P
ASS
status
.
Each
test
in
the
subset
retains
its
own
test
status
.
This
same
subset
is
available
over
HP-IB
as
\TST?".
Refer
to
HP-IB
service
mnuemonics
denitions
.
It
is
not
performed
upon
remote
preset.
2
ROM.
P
art
of
the
ROM/RAM
tests
and
cannot
be
run
separately
.
Refer
to
the
\Digital
Control
Troubleshooting"
chapter
for
more
information.
3
CMOS
RAM.
V
eries
the
A9
CPU
CMOS
(long-term)
memory
with
a
non-destructive
write/read
pattern.
A
destructive
version
that
writes
over
stored
data
is
shown
in
T
able
10-2 .
Service
K
ey
Menus
and
Error
Messages
10-7
Содержание 8752C
Страница 22: ...Before Applying Power 15 6 Servicing 15 6 Index Contents 16 ...
Страница 38: ......
Страница 43: ...Figure 2 1 Measurement Uncertainty Window System Veri cation and Performance Tests 2 5 ...
Страница 80: ...Figure 2 15 Magnitude Dynamic Accuracy Test Setup 2 42 System Veri cation and Performance Tests ...
Страница 116: ......
Страница 122: ...Figure 3 1 Location of Major Assemblies 3 6 Adjustments and Correction Constants ...
Страница 176: ......
Страница 192: ...4 16 Start Troubleshooting Here ...
Страница 193: ......
Страница 194: ...Figure 4 7 HP 8752C Overall Block Diagram 2 of 4 Option 003 and 004 Start Troubleshooting Here 4 19 ...
Страница 195: ...Figure 4 7 HP 8752C Overall Block Diagram 3 of 4 Option 006 4 20 Start Troubleshooting Here ...
Страница 196: ...Figure 4 7 HP 8752C Overall Block Diagram 4 of 4 Option 004 and 006 Start Troubleshooting Here 4 21 ...
Страница 197: ......
Страница 221: ...5 24 Power Supply Troubleshooting ...
Страница 222: ......
Страница 225: ...Digital Control Group Block Diagram Figure 6 1 Digital Control Group Block Diagram Digital Control Troubleshooting 6 3 ...
Страница 267: ...Figure 7 18 25 MHz HI OUT Waveform from A14J1 Figure 7 19 60 MHz HI OUT Waveform from A14J1 Source Troubleshooting 7 27 ...
Страница 271: ...Figure 7 21 A14 Generated Digital Control Signals Source Troubleshooting 7 31 ...
Страница 301: ...Figure 9 2 Typical Smith Chart Traces of Good Short a and Open b Accessories Troubleshooting 9 7 ...
Страница 302: ......
Страница 366: ......
Страница 378: ...Figure 11 4 Typical ED Re ection Test Port 11 12 Error Terms ...
Страница 380: ...Figure 11 5 Typical ES Re ection Test Port 11 14 Error Terms ...
Страница 382: ...Figure 11 6 Typical ER Re ection Test Port 11 16 Error Terms ...
Страница 384: ...Figure 11 7 Typical EX with 10 Hz Bandwidth Figure 11 8 Typical EX with 3 kHz Bandwidth 11 18 Error Terms ...
Страница 386: ...Figure 11 9 Typical ET 11 20 Error Terms ...
Страница 407: ...Figure 12 5 High Band Operation of the Source Theory of Operation 12 21 ...
Страница 410: ...Figure 12 6 Receiver Functional Group standard and Option 003 12 24 Theory of Operation ...
Страница 411: ...Figure 12 7 Receiver Functional Group Option 003 and 004 Theory of Operation 12 25 ...
Страница 412: ...Figure 12 8 Receiver Functional Group Option 006 12 26 Theory of Operation ...
Страница 413: ...Figure 12 9 Receiver Functional Group Option 004 and 006 Theory of Operation 12 27 ...
Страница 416: ......
Страница 419: ...Figure 13 1 Module Exchange Procedure Replaceable Parts 13 3 ...
Страница 423: ...Major Assemblies Replaceable Parts 13 7 ...
Страница 425: ...Front Panel Assemblies Replaceable Parts 13 9 ...
Страница 427: ...Rear Panel Assemblies Replaceable Parts 13 11 ...
Страница 429: ...Cables Top View Replaceable Parts 13 13 ...
Страница 431: ...Front Panel Cables and Attaching Hardware Replaceable Parts 13 15 ...
Страница 433: ...Rear Panel Cables and Attaching Hardware Replaceable Parts 13 17 ...
Страница 435: ...Source and Sampler Parts Standard and Option 003 Replaceable Parts 13 19 ...
Страница 437: ...Source and Sampler Parts Option 004 006 Replaceable Parts 13 21 ...
Страница 439: ...Source and Sampler Parts Options 004 and 003 004 Replaceable Parts 13 23 ...
Страница 441: ...Source and Sampler Parts Option 006 Replaceable Parts 13 25 ...
Страница 443: ...Display Bezel Assembly Replaceable Parts 13 27 ...
Страница 445: ...Chassis Parts Replaceable Parts 13 29 ...
Страница 447: ...Top View of Attaching Hardware and Post Regulator Fuses Replaceable Parts 13 31 ...
Страница 449: ...Bottom View of Attaching Hardware Replaceable Parts 13 33 ...
Страница 488: ......