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OPERATION
Axioscope 5/7/Vario
Illumination and contrast methods in reflected light …
ZEISS
03/2018
430035-7344-001
117
4.3.4
Setting reflected light TIC
(1) Application
The reflected light TIC method (Micro-interferometry; TIC = Total Interference Contrast in the circular
polarized light) is used in imaging and measuring specimen structures which are on hand in different
azimuths.
(2) Instrumentation
−
Axioscope with adjusted HAL 100 halogen
illuminator mounted on the reflected light
barrel
−
Objectives: EC Epiplan-Neofluar, Epiplan with
additional label "DIC" or "Pol"
−
6x20 mm compensator slot
−
TIC slider 6x20 mm with appropriate C DIC
P&C stepped reflector module
(3) Setting reflected light TIC
•
Place the sample (e.g. a stepped object) on the stage and adjust the microscope for reflected light
brightfield microscopy as described in section 4.3.1.
•
Swing the C-DIC P&C reflector module on the reflector turret into the beam path.
•
Slide the 6x20 mm TIC slider in the compensator slot 6x20 mm (
1
). You will see chromatic
interference stripes in the field of view. Using the control knob (
2
) of the TIC slider, move the
black interference stripe by sight to the middle of the field of view.
•
To choose the structure to be measured, turn the knob (
1
) on the TIC slider until the
interference stripes are vertical to the direction in which the specimen is broken down (see
The interference stripes can be shifted with the aid of the control button (
2
).
The step height SH is then determined with the following formula:
a
b
n
SH
2
2
λ
=
∆
=
Where SH = step-height in nm
n = refractive index of the environment, mostly air (n = 1)
∆
= phase difference
a = distance between interference stripes
b = offset of the interference stripes along the step
λ
= wave length of the illumination in nm
Fig. 4-17
TIC slider 6x20 mm