OPERATION
ZEISS
Illumination and contrast techniques
Axio Observer
166
431004-7244-001
12/2016
5.12.10
Setting up reflected light TIC
(1)
Application
The reflected-light TIC technique (microinterferometry; TIC = Total Interference Contrast in circularly
polarized light) can be used to image and measure object structures available in different azimuths.
(2)
Instrument equipment
−
Axio Observer materials with attached microLED
or adjusted HAL 100 illuminator
−
EC Epiplan-Neofluar or Epiplan objectives with
additional designation "DIC" or "Pol".
−
6x20 TIC slider with accompanying C-DIC P&C
reflector module.
(3)
Setting reflected light TIC
•
Place the specimen (e.g. a step-shaped object)
on the stage and prepare the microscope as
described in section 5.12.5 for reflected light
brightfield.
•
Swivel in the C-DIC/TIC P&C reflector module
on he reflector turret (Fig. 154/
7
) into the beam
path.
•
Insert TIC slider 6x20 (see Fig. 159) into the slot
below the nosepiece. In the field of view,
colored interference fringes appear.
•
To select the structure to be measured, turn selector wheel (Fig. 159/
2
) of TIC slider or modulator
turret until the interference fringe pattern is vertical to the splitting direction of the specimen. Use the
adjusting screw (Fig. 159/
1
) of the TIC slider to shift the interference fringes.
The step height is then determined using to the following formula:
a
2
b
2
n
d
λ
=
∆
=
where: d = step height in nm
n = refractive index of the environment, usually air (n = 1)
∆
= path difference
a = spacing of interference fringes
b = offset of interference fringes at the step
λ
= wavelength of the illumination in nm
Fig. 159
TIC slider 6x20
Summary of Contents for Axio Observer Series
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