2-7
SM 701730-01E
Performance Testing
2
2.2.9 Timebase Accuracy Test
Testing Procedure
1.
Enter the following settings on the DL1720E/DL1740E/DL1740EL.
CH1
Display:
ON
V/div:
50 mV/div
Coupling:
DC 50
Ω
Other than CH1
Display:
OFF
DISPLAY
Format:
Single
ACQ
Record Length:
10 k
TIME/DIV
2
µ
s/div
MEASURE
Mode:
ON
Item Setup (CH1):
Freq
2.
Input a 500.2 MHz, 300 mV
P-P
sinewave from the calibrator to CH1.
3.
Confirm that the CH1 Freq becomes 200
±
25 kHz.
4.
Enter the setting below, then input a 200.1 MHz, 300 mV
P-P
sinewave.
TIME/DIV:
5
µ
s/div
5.
Confirm that the CH1 Freq becomes 100
±
10 kHz.
Items to Be Checked
That the product specification is met.
Specification:
±
0.005%
2.2.10 Input Signal Bandwidth
Specification:
DC–500 MHz (–3dB) DC 50
Ω
(excluding the 2 mV/div and 5 mV/div)
DC–400 MHz (–3dB) DC 50
Ω
(2 mV/div and 5 mV/div)
DC–400 MHz (–3dB) 1 M
Ω
(probe terminal)
Testing Procedure
1.
Execute calibration (see section 4.6, “Performing Calibration” in the DL1720E/
DL1740E/DL1740EL user’s manual (IM 701730-01E)).
2.
Enter the following settings on the DL1720E/DL1740E/DL1740EL.
CH (all channels)
Display:
ON
Coupling:
DC 50
Ω
DISPLAY
Format:
Single
ACQ
Record Length:
1 k
Mode:
Average
Weight:
4
TIME/DIV
2 ns/div
SIMPLE (Trigger)
Source:
Input channel
MEASURE
Mode:
ON
Item Setup (all channels):
Sdev
T-Range1:
–5.00 div
T-Range2:
5.00 div
3.
Input a sinewave from the calibrator to the channel under test.
4.
Using the table below, measure Sdev on the input waveform, and confirm that it
lies within the judgment criteria.
V/div
Input Amplitude (
P-P
)
Input Frequency
Judgement Criteria
1 V/div
5 V
500 MHz
1.26 to 1.98 V
200 mV/div
1.2 V
500 MHz
301 to 476 mV
50 mV/div
0.3 V
500 MHz
75.1 to 119 mV
10 mV/div
60 mV
500 MHz
15.1 to 23.8 mV
5 mV/div
30 mV
400 MHz
7.51 to 11.9 mV
2 mV/div
12 mV
400 MHz
3.01 to 4.76 mV
2.2 Tests for the DL1720E/DL1740E/DL1740EL
