2-10
SM 701730-01E
2.2.14 EXT Trigger Level Accuracy Test
Specification:
±
(10% of s 50 mV)
Testing Procedure
1.
Enter the following settings on the DL1720E/DL1740E/DL1740EL.
CH1
Display:
ON
V/div:
0.2 V/div
Probe:
1:1
Other than CH1
Display:
OFF
DISPLAY
Format:
Single
ACQ
Record Length:
10 k
Mode:
Box Average
TIME/DIV
200
µ
s/div
SIMPLE (Trigger)
Source:
Ext
Range:
±
1 V (for the DL1720E)
Probe:
1:1
CURSOR
Type:
Marker
Cursor1:
0.00 div
2.
Input a sinewave of 1.6 V
P-P
, 0 V offset, and 1 kHz from the calibrator to CH1
and the EXT trigger input terminal on the rear panel. Pass the input to the EXT
trigger input terminal on the rear panel through a 50
Ω
terminator.
3.
Confirm that the value V
h
read by the cursor when the polarity is
↑
, and the
value V
l
when it is
↓
lie within the judgment criteria below.
Trigger Level
Judgment Criteria
700 mV
580 mV
≤
(V
h
+ V
l
)/ 2
≤
820 mV
0 mV
–50 mV
≤
(V
h
+ V
l
)/ 2
≤
50 mV
–700 mV
–820 mV
≤
(V
h
+ V
l
)/ 2
≤
–580 mV
4.
Since you must cancel the trigger level offset for the trigger sensitivity test, use
the V
h
and V
I
values measured when the trigger level was set to 0 mV under this
item, set
V
c
= –( V
h
+ V
l
) / 2,
then use this trigger level for the next EXT trigger sensitivity and trigger out test.
2.2 Tests for the DL1720E/DL1740E/DL1740EL
