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Registers
ADCTEST0 (0x61B5)
–
ADC Tuning
Bit
Name
Reset
R/W
Description
No.
7:6
ADC_VREF_ADJ[1:0]
00
R/W
Quantizer threshold control for test/debug
5:4
ADC_QUANT_ADJ[1:0]
01
R/W
Quantizer threshold control for test/debug
3:1
ADC_GM_ADJ[2:0]
000
R/W
Gm control for test/debug
0
ADC_DAC2_EN
0
R/W
Enables DAC2 for enhanced ADC stability
ADCTEST1 (0x61B6)
–
ADC Tuning
Bit
Name
Reset
R/W
Description
No.
7:4
ADC_TEST_CTRL[3:0]
0000
R/W
ADC test mode selector
3:2
ADC_C2_ADJ[1:0]
11
R/W
Used to adjust capacitor values in ADC
1:0
ADC_C3_ADJ[1:0]
10
R/W
Used to adjust capacitor values in ADC
ADCTEST2 (0x61B7)
–
ADC Tuning
Bit
Name
Reset
R/W
Description
No.
7
–
0
R0
Reserved. Read as 0
6:5
ADC_TEST_MODE
00
R/W
Test mode to enable output of ADC data from demodulator. When enabled, raw
ADC data is clocked out on the GPIO pins.
00:
Test mode disabled
01:
Data from both I and Q ADCs is output, data rate 76 MHz
10:
Data from I ADC is output. Two and two ADC samples grouped, data rate
38 MHz
11:
Data from Q ADC is output. Two and two ADC samples grouped, data rate
38 MHz
4:3
AAF_RS[1:0]
00
R/W
Controls series resistance of AAF
2:1
ADC_FF_ADJ[1:0]
01
R/W
Adjust feedforward
0
ADC_DAC_ROT
1
R/W
Control of DAC DWA scheme
0: DWA (scrambling) disabled
1: DWA enabled
280
CC253x Radio
SWRU191C
–
April 2009
–
Revised January 2012
Copyright
©
2009
–
2012, Texas Instruments Incorporated