Teledyne ADFM Analog Output Module, Technical Manual, Page: 104 / 156

Appendix C
PI Run Individual Built-In Tests
Purpose: The PI BIT selects the individual built-in tests to run.
Format: PI nnnnn
Range: Firmware switches (see description).
Description: PI sets firmware switches that select the individual tests of the
Built-In Test function. When a bit is not set (0), the corre-
sponding test is not run; a set bit (1) runs the test. Entering
only PI runs the previously selected tests.
Command Description
PI1xxxxx Run selected test/s continually.
PIx1xxxx Run CPU RAM test.
PIxx1xxx Run CPU Real-Time Clock Test.
PIxxx1xx Run Timing Generator RAM Test.
PIxxxx1x Run Receiver RAM Test.
PIxxxxx1 Run the Electronics End To End Test; this test takes a timing
generator test signal and feeds it to the receiver input; it compares
the result with pre-determined values. This test does not test the
transducer electronics.
Example:
>pi
[BEGIN Built In Tests]
CPU RAM Test ........... PASS
Realtime Clock Test .... PASS
Timing Card RAM Test ... PASS
Demod RAM Test ......... PASS
[END Built in Tests]
PS - Show System Parameters
Purpose: Snds/displays ADFM system configuration data.
Format: PS n
Range: n = 0 (system)
Default: PS0
Description: PS0 sends the ADFM hardware/firmware information. For
example, the output may look like this:
page C-24 MGD Technologies, Inc.