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Raw Data
The y-axis shows the reflectance
energy entering the probe at the
respective integration time. The x-
axis is the wavelength of light in
nanometers (nm).
The checkboxes at the bottom are
used to add/remove to each of their
respective readings.
Peak Data
Accessed by clicking on the Peak Data Tab on the top right side of the Normalized Data Window.
Info
Integration Time (IT):
time in milliseconds used to sample the optical package detector array once.
Saturation:
Percentage of reflectance
Reflectance Flag:
The percentage of saturation. It will either be Low, Normal, or High.
Thickness (µm):
The thickness of the material shown in microns.
Converted Thickness:
The thickness of the material converted into another unit of thickness or weight.
This conversion can also be for a wet layer measurement converted into the projected dry thickness or
film-weight.