10-015490-01EN, Rev. 2, June 2020
Introduction
19
Introduction
The Olympus BTX III is a benchtop X-ray diffraction (XRD) analyzer designed
primarily for analyzing a variety of powder sample types. Phase identification is
obtained by comparing the diffraction signature of a sample with a database of XRD
mineral patterns.
The BTX III analyzer uses a low power X-ray source and 2-D charge-coupled device
(CCD) detector to obtain XRD data.
The BTX III analyzer incorporates the following independent safety protection
circuits:
•
Power key switch — Key must be inserted and in the ON position to turn the
system on.
•
X-ray warning indicators — LEDs on the front panel illuminate when X-rays are
being generated, and also during the power on sequence.
•
Sample carrier safety interlock — High voltage from the power supply is
interrupted and generation of X-rays ceases if the sample carrier is removed
during system operation.
Summary of Contents for BIX III
Page 6: ...Table of Contents vi 10 015490 01EN Rev 2 June 2020...
Page 8: ...10 015490 01EN Rev 2 June 2020 List of Abbreviations viii...
Page 12: ...10 015490 01EN Rev 2 June 2020 Labels and Symbols 4...
Page 28: ...10 015490 01EN Rev 2 June 2020 Introduction 20...
Page 36: ...10 015490 01EN Rev 2 June 2020 Chapter 1 28...
Page 64: ...10 015490 01EN Rev 2 June 2020 Chapter 4 56...
Page 82: ...10 015490 01EN Rev 2 June 2020 Chapter 5 74...
Page 84: ...10 015490 01EN Rev 2 June 2020 Appendix A 76...
Page 100: ...10 015490 01EN Rev 2 June 2020 List of Tables 92...
