Lumenera Lt-C1610, User Manual

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Teledyne Lumenera Lt Series Series Specifications • 13
Sony Sensor Limitation
• Max pixel saturated values: Max Pixel format bit depth – 4095 (12-bit)
2.3 Dynamic Range & Signal to Noise Ratio
Measurement Conditions
Specifications calculated according to EMVA-1288 standard, using white LED light.
Dynamic Range Test Conditions
•
Exposure 100 µs for 0% Full Light Level
•
Lt-x1610 exposure 6 ms, gain 1, variable light source from dark to saturation
•
Lt-x1630 exposure 40 ms, gain 1, variable light source from dark to saturation
• Lt-x1900 exposure 17 ms, gain 1, variable light source from dark to saturation
•
Lt-x1950 exposure 60 ms, gain 1, variable light source from dark to saturation
•
Lt-x1980 exposure 75 ms, gain 1, variable light source from dark to saturation
•
Lt-x2020 exposure 16 ms, gain 1, variable light source from dark to saturation
• Lt-x2050 exposure 45 ms, gain 1, variable light source from dark to saturation
• Lt-x2420 exposure 28 ms, gain 1, variable light source from dark to saturation
•
Lt-x2450 exposure 33 ms, gain 1, variable light source from dark to saturation
•
Lt-x3200 exposure 38 ms, gain 1, variable light source from dark to saturation
• Lt-x3840 exposure 43 ms, gain 1, variable light source from dark to saturation
• Lt-x4030 exposure 150 ms, gain 1, variable light source from dark to saturation
•
Lt-x4060 exposure 50 ms, gain 1, variable light source from dark to saturation
•
Lt-x4020 exposure 150 ms, gain 1, variable light source from dark to saturation
•
Lt-x4040 exposure 32 ms, gain 1, variable light source from dark to saturation
• Lt-x5500 exposure 10 ms gain 1, variable light source from dark to saturation
• Lt-x5470 exposure 3.5 ms, gain 1, variable light source from dark to saturation
•
Lt-x4430 exposure 3.5 ms, gain 1, variable light source from dark to saturation
•
Lt-x6480 exposure 3.5 ms, gain 1, variable light source from dark to saturation
SNR Test Conditions
•
Exposure 2000 µs
•
80% saturation
2.4 Mean Time between Failure (MTBF)
Teledyne Lumenera MTBF calculations use the Parts Count / Parts Stress method. Calculated
assembly FIT values are rounded up with margin to provide adequate headroom and the final
quoted MTBF is then rounded down to the nearest year.
In practice, MILSTD217F is used to model passive and simple active parts, such as diodes and
transistors, because manufacturer data is unreliable. When MILSTD217F models are used to
represent more than one physical part, worst case parameters are used. Manufacturer's data is
used to model more complicated active parts, such as buffers and FPGAs, because the internal
structures are not known, and the manufacturer data is more likely to be valid. When manufacturer
data is used, it is modified to meet specific use conditions using the Arrhenius equation and the
result is set to a 90% confidence level using the Chi-Squared Distribution Method. Again, when