GE P741, Technical Manual

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Technical Data P74x/EN TD/Na7
MiCOM P741, P742, P743 (TD) 2-13
TD
COMMISSION TESTS
Monitor Bit 1 (up to 8):
Binary function link strings, selecting which
DDB signals have their status visible in the
Commissioning menu, for test purposes
Test Mode: (CU)
Test Mode: Enabled or Out of Service
•
87BB trip blocked but 50BF (back trip)
enable per zone
•
87BB and 50BF trip blocked per zone
•
All the protections (87BB, Dead Zone,
General 50BF, Local 50BF, O/C) disabled
•
87BB disable but 50BF (back trip) enable
for all zones
Test Mode: (PU)
Test mode: Disabled / 50BF Disabled /
Overhaul
Test Pattern:
Configuration of which output contacts are
to be energised when the contact test is
applied.
Static Test Mode: Disabled/Enabled
Opto input voltage range:
24-27 V
30-34 V
48-54 V
110-125 V
220-250 V
Custom Opto Input 1
(up to # = max. opto no. fitted)
Custom options allow independent
thresholds to be set per opto, from the
same range as above
Filter Control:
Opto Input Labels
Opto Input 1 up to: 8 for P741
16 for P742
24 for P743
User defined text string to describe the
function of the particular opto input.
Outputs Labels
Relay 1 up to: 8 for P741 & P742
16 for P743
User defined text string to describe the
function of the particular relay output
contact.
IED CONFIGURATOR
Switch Conf.Bank:
No Action / Switch Banks
IEC61850 GOOSE
GoEna: Disabled/Enabled
Test Mode: Disabled / Enabled
VOP Test Pattern: 0x00000000 / 0xFFFFFFFF
Ignore Test Flag:
No/Yes