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4.3.2.4 Leakage Setting (Leakage-HI and Leakage-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the
Leakage-HI
or
Leakage-LO
parameter. The display will appear as follows:
Leakage-HI Leakage-LO
Enter the new Leakage current via the numeric keypad and then press the ENTER key to
accept the new parameter or press the EXIT key to escape from the edit.
Line Configuration
Leakage in the Run Test mode refers to the amount of current, which flows from the enclosure
(case) of the DUT, to the neutral side of the line input. The Leakage-HI trip limit is used to
program the maximum allowable earth leakage current of the DUT before failure. The
Leakage-LO trip limit is used to program the minimum allowable earth leakage current of the
DUT before failure. The Leak HI trip limit also controls the earth leakage configuration as
shown in FIG.1.
When the Leakage-HI trip limit is set to 0, S3 is closed which disables the earth leakage test
and connects the neutral of the DUT input to the ground of the DUT.
4.3.2.5 Power Setting (Power-HI and Power-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the
Power-HI
or
Power -LO
parameter. The display will appear as follows: