Associated Research 3030D, Operation And Service Manual, Page: 29 / 43

OPERATION
25
The memory lock screens appear as follows:
or
To toggle the Memory Lock function on and off use the up or down arrow keys, then
press exit to select, or press the set key again to reach the Key Lock screens.
Use the following chart to set the Key Lock and Memory Lock for your application.
Key Lock Memory Lock Accessible keys
Off Off
All
Off On All
On Off TEST, RESET, and up-down arrows for memory selection
On On TEST and RESET
C. OPERATING PROCEDURES:
1. If the defaults are acceptable then be sure to connect the appropriate test leads to the
device under test (DUT) or test fixture. Be sure to connect the safety ground (on the rear
panel) to a suitable known good ground before energizing this instrument. Then connect
the return lead first to the test fixture or the DUT followed by the high current lead.
Check your connections to be sure they are making good contact and that the test station
or area is clear of debris or other personnel.
DO NOT TOUCH THE DEVICE UNDER TEST ONCE THE TEST HAS BEEN
STARTED.
2. Please follow the setup procedures to set or recall setups from memory
programs. The display will show the number of the Memory Program and
the value of Dwell time, Test Current and High Limit resistance trip point as follows:
S e t M __ XXX. Xs
XX . XA XXX m
Ω
or
S e t MX XXX . X s
XX . XA XXX m
Ω
If the set data is to be stored in the memory program, please follow the procedure outlined
in the setup procedures on
Storage of Memory Program .
3. To initiate a test press the TEST switch on the front panel.
The instrument will output the set current for the length of time set on the dwell timer.
The display will show:
D w e l l MX XXX . X s
X X.XX A XXX m
Ω
WARNING
Memory Lock = ON
Memory Lock = OFF