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44 Multi image processor User’s Guide – Test patterns
8.3 Grid (Angle) test pattern
The last test pattern available in the processor unit is the Grid (Angle) test pattern. This is
used to create a reference grid in a dome or a cylinder.
Parameters to specify for this grid are ‘to’ and ‘from’ angles (in degrees) in horizontal and
vertical direction. The frequency of the reference points can also be specified, as seen in
Figure 8-5.
Figure 8-5. Grid (Angle) test pattern
8.4 Turning test patterns on and off
When using a test pattern it can be convenient to disable the warp calibration grid. Select
“Layers” in the Calibration Panel toolbar and disable Warp, Figure 8-6.
Figure 8-6. Disabling the warp grid