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BeamMonitor BM+
35,0(6
35
Revision 02 EN - 02/2022
9.4.2
Advanced settings
1. Click on the
Advanced
tab.
2. Edit the options according to the ex-
planations in Tab. 9.2 on page 35.
Option
Explanation
Save device settings
All options marked with an asterisk in the
Device control
menu can be
saved in the EEPROM of the device.
These and other options for saving / loading configurations are de-
scribed in chapter 9.3.5 „Saving options“ on page 30.
Rotational speed in rpm *
For the BeamMonitor BM+, the rotation speed of the measuring tip is
always 1 562 rpm.
# Pixel in x/y *
The number of pixels determines the resolution of the measurement.
X
Enter the resolution in x-direction / y-direction in the corresponding
fields.
Calibrated wavelength(s) in nm *
The “calibrated wavelength” is the wavelength at which the device has
been validated. This is stored in the device and is displayed in the LDS.
Used wavelength in nm *
To calculate the beam quality factor M², the used wavelength must
be entered. Depending on the display in the option
Calibrated
wavelength(s) in nm,
the used wavelength can be entered in a defined
range.
For example, with a „calibrated wavelength“ of 1 064 nm, the used
wavelength can be entered from 1 000 - 1 100 nm.
Use one of the following options to set the wavelength of the laser used:
X
Enter a value in the input field.
X
Use the slider below the input field.
Focal length of focusing optics in mm *
If several planes of a caustic have been measured, the caustic fit and the
entered focal length are used to calculate the raw beam diameter on the
focusing optics.
X
Enter the used focal length of the focusing optics of the laser sys-
tem.
Averaging *
If this option is enabled, different algorithms for averaging a plane mea-
surement can be selected in the drop-down list. Averaging over several
measurements can be useful, for example, when measuring a laser with
significant power fluctuations.
1. Set the check mark to enable the option
2. Select an algorithm from the drop-down list:
•
Arithmetic Average
: The measured values for each pixel are added
together and divided by the number of planes.
•
Max. intensity per pixel
: The values from all the measurements are
compared for each pixel and only the maximum value for each one
is displayed.
•
Max. lines
: The values from all the measurements are compared for
each line (meaning the line issuing from the measuring device in the
x-direction for example) and only the maximum value for each one is
displayed.
Number of averaged planes *
X
With the
Averaging
option enabled, enter the number of plane
measurements for averaging.
Tab. 9.2:
Options in the
Device control > Advanced
tab of the
Single planes
measuring mode
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